| Компонент | Описание | Производитель | PDF | Buy |
| B57871S0123+000 | Temperature Measurement | EPCOS |  |  |
| B57881S0123+000 | Temperature Measurement | EPCOS | | |
| B57871S0123000 | NTC thermistors for temperature measurement | EPCOS | | |
| B57871S0123000 | NTC thermistors for temperature measurement | EPCOS | | |
| B57881S0123000 | NTC thermistors for temperature measurement | EPCOS | | |
| B57881S0123F000 | NTC thermistors for temperature measurement | EPCOS | | |
| B57871S0123F000 | NTC thermistors for temperature measurement | EPCOS | | |
| B57871S0123H000 | NTC thermistors for temperature measurement | EPCOS | | |
| B57881S0123H000 | NTC thermistors for temperature measurement | EPCOS | | |
| B57871S0123J000 | NTC thermistors for temperature measurement | EPCOS | | |
| B57881S0123J000 | NTC thermistors for temperature measurement | EPCOS | | |
| IDT70T651S012BC | High-speed 2.5V 256 x 36 asynchronous dual-port static RAM, 12ns | Integrated Device Technology | | |
| IDT70T631S012BC | High-speed 2.5V 256 x 18 asynchronous dual-port static RAM, 12ns | Integrated Device Technology | | |
| IDT70T651S012BCI | High-speed 2.5V 256 x 36 asynchronous dual-port static RAM, 12ns | Integrated Device Technology | | |
| IDT70T631S012BCI | High-speed 2.5V 256 x 18 asynchronous dual-port static RAM, 12ns | Integrated Device Technology | | |
| IDT70T651S012BF | High-speed 2.5V 256 x 36 asynchronous dual-port static RAM, 12ns | Integrated Device Technology | | |
| IDT70T631S012BF | High-speed 2.5V 256 x 18 asynchronous dual-port static RAM, 12ns | Integrated Device Technology | | |
| IDT70T651S012BFI | High-speed 2.5V 256 x 36 asynchronous dual-port static RAM, 12ns | Integrated Device Technology | | |
| IDT70T631S012BFI | High-speed 2.5V 256 x 18 asynchronous dual-port static RAM, 12ns | Integrated Device Technology | | |
| 841S012BKILF | Crystal-to-0.7V Differential HCSL/LVCMOS Frequency Synthesizer | Integrated Device Technology | | |
