Компонент | Описание | Производитель | PDF | Buy |
IDT71V547 | 128K X 36, 3.3V Synchronous SRAM with ZBT Feature, Burst Counter and Flow-Through Outputs | Integrated Device Technology | | |
B57452V5472H062 | NTC thermistors for temperature measurement | EPCOS | | |
B57442V5472H062 | NTC thermistors for temperature measurement | EPCOS | | |
B57251V5472J060 | NTC thermistors for temperature measurement | EPCOS | | |
B57442V5472J062 | NTC thermistors for temperature measurement | EPCOS | | |
B57452V5472J062 | NTC thermistors for temperature measurement | EPCOS | | |
B57352V5473H060 | NTC thermistors for temperature measurement | EPCOS | | |
B57352V5473J060 | NTC thermistors for temperature measurement | EPCOS | | |
MV5474C | T-1 SOLID STATE LAMPS | Fairchild Semiconductor | | |
MV5477C | LOW PROFILE T-1 SOLID STATE LAMPS | QT Optoelectronics | | |
MV5477C | LOW PROFILE T-1 SOLID STATE LAMPS | Fairchild Semiconductor | | |
MALIEYH07CV547B02K | Aluminum Capacitors Standard - 105 `C Snap-in | Vishay Siliconix | | |
MALIEYN07CV547B02K | Aluminum Capacitors Standard - 85 `C Snap-In | Vishay Siliconix | | |
IDT71V547S100PF | 128K X 36, 3.3V Synchronous SRAM with ZBT Feature, Burst Counter and Flow-Through Outputs | Integrated Device Technology | | |
IDT71V547S100PFI | 128K X 36, 3.3V Synchronous SRAM with ZBT Feature, Burst Counter and Flow-Through Outputs | Integrated Device Technology | | |
IDT71V547S80PF | 128K X 36, 3.3V Synchronous SRAM with ZBT Feature, Burst Counter and Flow-Through Outputs | Integrated Device Technology | | |
IDT71V547S80PFI | 128K X 36, 3.3V Synchronous SRAM with ZBT Feature, Burst Counter and Flow-Through Outputs | Integrated Device Technology | | |
IDT71V547S85PF | 128K X 36, 3.3V Synchronous SRAM with ZBT Feature, Burst Counter and Flow-Through Outputs | Integrated Device Technology | | |
IDT71V547S85PFI | 128K X 36, 3.3V Synchronous SRAM with ZBT Feature, Burst Counter and Flow-Through Outputs | Integrated Device Technology | | |
IDT71V547S90PF | 128K X 36, 3.3V Synchronous SRAM with ZBT Feature, Burst Counter and Flow-Through Outputs | Integrated Device Technology | | |