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![](/forums/images/ca_evo_db/misc/spacer.gif) | SN74BCT8374ADW DATASHEET | ![](/forums/images/ca_evo_db/misc/spacer.gif) |
Компонент | Описание | Производитель | PDF | Buy |
SN74BCT8374ADW | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
![](/forums/images/ca_evo_db/misc/spacer.gif) | *SN74BCT8374A*: Расширенные результаты | ![](/forums/images/ca_evo_db/misc/spacer.gif) |
Компонент | Описание | Производитель | PDF | Buy |
SN74BCT8374A | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374A | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADW | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADW | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADWE4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADWE4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADWG4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADWR | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADWR | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADWRE4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADWRE4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ADWRG4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ANT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ANT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ANTE4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SN74BCT8374ANTE4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
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