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![](/forums/images/ca_evo_db/misc/spacer.gif) | SNJ54BCT8374AFK DATASHEET | ![](/forums/images/ca_evo_db/misc/spacer.gif) |
Компонент | Описание | Производитель | PDF | Buy |
SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
![](/forums/images/ca_evo_db/misc/spacer.gif) | *SNJ54BCT8*: Расширенные результаты | ![](/forums/images/ca_evo_db/misc/spacer.gif) |
Компонент | Описание | Производитель | PDF | Buy |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8240AJT | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8244AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8244AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8244AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8244AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8244AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8244AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8245AFK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8245AFK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8245AJT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8245AJT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8373AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8373AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas Instruments | ![](/images/pdf_icon.png) | ![](/images/alisearch.png) |
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